Leica Metallic MikroskopDM12000MKa tɛmɛ optical principle, a tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ. Ka tɛmɛ fotow ye kɔnɔ, ka tɛmɛ fotow ye kɔnɔ, ka tɛmɛ fotow ye kɔnɔ, ka tɛmɛ fotow ye kɔnɔ, ka tɛmɛ fotow ye kɔnɔ, ka tɛmɛ fotow ye kɔnɔ. Kɔc ye tɛ̈n yen, a bɛ se ka tɛ̈n yen ka tɛ̈n yen ka tɛ̈n yen ka tɛ̈n yen ka tɛ̈n yen ka tɛ̈n yen.

DM12000M Leica Metaphase Microscope Features:

A. Optical design yam, lëu bï ya gäm macro mode rapid initial inspection ku tilt ultraviolet light path function (OUV, tilt ultraviolet observation mode), ka cïï bɛ̈n ya juak dɛ̈t, ka cïï bɛ̈n ya juak ka cïï bɛ̈n ya juak ka cïï bɛ̈n ya juak ka cïï bɛ̈n ya juak ka cïï Teknoloji LED ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ

2, DM12000M Leica Metaphase Microscope, ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n A bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛm

3, awowa ye kɛ̈ɛ̈l ye yiic, ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ FPD, MASK board inspection offers a suitable lighting, and can be equipped with polarizing mirrors to achieve a simple polarizing observation of the projected light. FPD, MASK board inspection provides a suitable lighting, and can be equipped with polarizing mirrors to achieve a simple polarizing observation of the projected light. High contrast, higher resolution, higher magnification inspection Fluorescence observation method used for photogravure adhesive residual inspection Fluorescence spectroscope module UV optical system can provide higher contrast and resolution, with a resolution up to 0.12μm.

4, be fluorescence suguya juëc ye U.B.G wala, ye luɔ̈ɔ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ̈i bɛ̈ɛ Interface de communication ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k ye kɛ̈k

5.Including special infrared objects and other accessories, to correct the difference from visible light to near infrared band light, for IC deep or internal inspection, can achieve complete inspection of WAFER BUMP automatic line wide CD measurement accessories with subpixel technology to achieve highly accurate CD measurement.

6, a tɛ̈n yenë riɛl tɔ̈ɔ̈u tɔ̈ɔ̈u tɔ̈ɔ̈u tɔ̈ɔ̈u tɔ̈ɔ̈u tɔ̈ɔ̈u tɔ̈ɔ̈u tɔ̈ɔ̈u tɔ̈ɔ One-click manipulation design users can easily complete the magnification conversion and associated lighting and lining effects. A ye raan ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi ye luɔɔi