EVM Environment Monitor- Fornitore global

Beijing, Chaoyang District, Shenggu Middle Road, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F, Building F

	EVM7	EVM-4	EVM-3
Temperatur	√	√	√
Rɛlatif humidity	√	√	√
Wind speed (optional accessories) (Lɛɛr)	√	√	√
Kä ye kek looi (mass concentration)	√		√
Gas ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan ye raan9Sensor ye optional)	√	√
Karbon dioksid	√	√
Aw ye volatile organic compounds sugandi	√

Testing Metod	Unit	Nyuɔ̈th Resolution	Nyuɔ̈th Skala	Wurtin Precision
Partikel
90°Light diffusion/Fotometri Integral	mg / m3	0.001	0.000-200.0	+/-15%(rel ARD*)
	Optionalppbwalamg /m3	1	0 - 50,000	Kalibrasiɔn+/-5% /2%***
	mg/m3	1	0 - 20,000	+/-15%(rel ARD*)
Particle size range	mm	N/A	0.1 - 10	**
Sensor elektrokemikal
CO Karbon monoksid sensor	ppm	1	0 - 1,000	Signal+/-5%/2%
Cl2 Sensor gas chlorine	ppm	0.1	0.0 - 20	Signal+/-5%/2%
EtO Sensor Ethane Epoxyde	ppm	0.1	0.0 - 20	Signal+/-5%/2%
HCNHydrogen cyanide sensor	ppm	0.1	0.0 - 50	Signal+/-5%/2%
H2SSensor hydrogen sulfide	ppm	1	0.0 - 500	Signal+/-5%/2%
NO1Sensor oksid nitrik	ppm	0.1	0.0 - 100	Signal+/-5%/2%
NO2 Nitrogen dioksidSensor	ppm	0.1	0.0 - 50	Signal+/-5%/2%
O2 Sensor oksijen	%	0.1	0.0 - 30	Signal+/-5%/2%
SO2 Sensor sulfur diokside	ppm	0.1	0.0 - 50	Signal+/-5%/2%

Testing Metod	Unit	Nyuɔ̈th Resolution	Nyuɔ̈th Skala	Wurtin Precision
VOC: 10.6eVDetektor Ionization optik
Sensitivity dɔŋPID	Optionalppmwalamg /m3	0.01	0.00 - 2,000	Kalibrasiɔn+/-5%/ 2%***
Sensitivity DïtPID	Optionalppbwala μg /m3	1	0 - 50,000	Kalibrasiɔn+/-5%/ 2%***
CO2
NDIR（ non-dispersed infrared)	ppm	1	0 - 5,000ppm; Automatic Measurement (non-condensation) (Automatic Measurement) (non-condensation) (non-condensation) (non-condensation) (non-condensation) (non-condensation) (non-condensation) (non-condensation) (non-condensation) (non-condensation)	+/-100ppm@20 deg CGas2,000ppmPressureGüc1 bar
Temperatur
Diode	deg C	0.1	0.0 - 60.0	+/- 1.1deg C
Diode	deg F	0.1	32.0 - 140	+/- 2deg F
Rɛlatif humidity
Kapasitɛr	%Humidity	0.1	0.0 - 100	Signal+/-5%RH* 10%-90%
Wind speed
Thermal Sensitive Wind Speed Probe	meter/sec	0.1	0.0 -20	Signal+/-0.12m/s + 4.5%
Thermal Sensitive Wind Speed Probe	feet/min	1	0 - 3940	Signal+/-23.6ft/min + 4.5%

EVMMonitor ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän ɣän

TSI Quest ™ EVM Environmental Monitor bɛ kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye Kɔn ye tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n yenë yen tɛ̈n

Funksiɔn & Benefits

Ø Ajuiɛɛr tök ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l

Ø ye kä wïc bɛ̈n ya naŋ tɛ̈n yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen

Ø 90 degrees light scattering laser photometer, ye particles measure real time

Ø patent technology designed particle size cutting device; Ø patent technology designed particle size cutting device; Ø patent technology designed particle size cutting device; Ø patent technology designed particle size cutting device; Ø patent technology designed particle size cutting device; No need external cyclone separator

Ø Pump ye tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u bï ya tɔ̈ɔ̈u

Ø Ekran dɔ̈ŋ ye kɔn yiic, ye kɔn yiic, ye kɔn yiic, ye kɔn yiic, ye kɔn yiic, ye kɔn yiic, ye kɔn yiic, ye kɔn yiic

A tɔŋ tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n