KF-6600II Multi Pulse Cable Failure Tester

Kä ye kek looi ku kä ye kek looi:

1, a lëu bï ya tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka t

2, tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈

3, a bɛ se ka tɛmɛ 35KV ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ

4, a ye tɛmɛ "multi-pulse method" test technology, ku a ye tɛmɛ "high pressure flash method" ku "low pressure pulse method".

5, të cenë pulse mode juëc ya looi, ye kë ye cɔl high resistance failure ye nyuɔɔth ke ye kë ye cɔl low voltage pulse short circuit failure characteristic, ye kë ye cɔl low voltage pulse short circuit failure characteristic, ye kë ye cɔl low voltage pulse short circuit failure characteristic.

6, a naŋ menu ye tɔŋ Chinese ye tɔ̈u thïn ku a naŋ keys ye tɔ̈u thïn ye tɔ̈u thïn ye tɔ̈u thïn ye tɔ̈u thïn ye tɔ̈u thïn.

7, tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ

8, LCD screen ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni.

9, a tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n Kä ye them tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n t

10, a naŋ tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ

11, key definition is simple and clear, operation is simple, reliability is high, measurement method is simple and fast. 11, key definition is simple and clear, operation is simple, reliability is high, measurement method is simple and fast. 11, key definition is simple and clear, operation is simple, reliability is high, measurement method is simple and fast.

12, built-in power supply, can test cable's open circuit and low resistance short circuit failure in no power environment. 12, built-in power supply, can test cable's open circuit and low resistance short circuit failure in no power environment. 12, built-in power supply, can test cable's open circuit and low resistance short circuit failure in no power environment.

13, a naŋ USB interface, a lëu bï data copy tɔ̈u mobile hard drive.

14, a naŋ network interface, a lëu bï data ya tɛmɛ në network yic.

II, kä ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n ye kɛ̈n:

1. test method: multi-pulse method; 1. test method: multi-pulse method; 2. Impact high voltage current sampling method; Low pressure pulse method.

2.High Pressure: Lower than 35KV

3. Data sampling rate: 120MHz, 90MHz, 60MHz, 30MHz, 15MHz

4. Test distance: > 50Km

5.Reading Resolution: <0.5m

6.System test precision is less than 50cm. System test precision is less than 50cm. System test precision is less than 50cm. System test precision is less than 50cm. System test precision is less than 50cm. System test precision is less than 50cm.

7, tɛm pulse amplitude: ye 400 VP-P

8.Multi-pulse sending and failure reflection signals automatic display, makes failure characteristics waveform representation very simple. 8.Multi-pulse sending and failure reflection signals automatic display, makes failure characteristics waveform representation very simple. Wave ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l ye kɛ̈l

9. ye tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ̈n yenë tɛ A lëu ba waveforms juëc tɔ̈ɔ̈u.

10. A lëu bɛ̈n ya tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a tɛ̈n yenë a t Ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ

11.Built-in power supply: a lëu bï luui ka tɛmɛ lɛr 6 ka tɛmɛ lɛr 6 ka tɛmɛ lɛr 6 ka tɛmɛ lɛr 6 ka tɛmɛ lɛr 6 ka tɛmɛ lɛr 6.

Kä ye looi: Temperature -10 ℃ ~ + 45 ℃, relative humidity 90%, atmospheric pressure 750 ± 30mmHg.