Sample preparation for TEM, SEM and LM (Sample preparation for TEM, SEM and LM) (Sample preparation for TEM, SEM and LM) (Sample preparation for TEM, SEM and LM) (Sample preparation for TEM, SEM and LM)

Leica EM RES102 ee masin ye cɔl ion beam grinding ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam ye cɔl ion beam

Kä ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ɛ̈k ye kɛ̈ Ka fara ion grinding ye kɔnɔ

Ka tɛmɛ, Leica EM RES102 bɛ se ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ.

› Ion beam grinding ye raan tök wala rou ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök ye raan tök. A ye cɔl Saddle Field Ion Source bï ya tɔ̈ɔ̈u në electron beam transparent thin zone.

› Programmed control of ion entry angle variation, suitable for completing special sample preparation purposes, such as FIB sample cleaning to reduce amorphous noncristal layers. Programmed control of ion entry angle variation, suitable for completing special sample preparation purposes, such as FIB sample cleaning to reduce amorphous noncristal layers.

› Ion beam polishing maximum polishing area can reach 25mm.

› Ion beam cleaning ee luɔɔi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi bï ya looi.

› Sample surface lining enhancement effect, can replace chemical etching effect. Sample surface lining enhancement effect, can replace chemical etching effect. Sample surface lining enhancement effect, can replace chemical etching effect.

› 35° ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ

› 90° slope cutting ee luɔ̈ɔ̈i bï semiconductor samples wala assemblage devices looi në composite structures, ye luɔɔi de mechanical pre-processing ye wïc në dhöl kënë yic.

- Yïn ye yɔ̈ɔ̈r

Walasa ka tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ tɛmɛ t Pre-pumping Room

Sisitɛm ye samples ye waar ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ.

Sample table kënë ee luɔɔi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi b Sampel SEM

A lëu bï ya looi ka tɛ̈n bɛ̈n ya looi ka tɛ̈n bɛ̈n ya looi ka tɛ̈n bɛ̈n ya looi ka tɛ̈n bɛ̈n ya looi. Adapter ye luɔ̈ɔ̈i bï SEM sample seat ye tɔ̈ɔ̈u në luɔɔi de kä ye kek looi yiic, ye tɔ̈ɔ̈u në 3.1mm diameter plug.

A ye cɔl slope cutting sample table, a lëu bï ya luui në tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de tɛmɛ de SEM clamp holder to hold small sampleswith maximal dimensions of 5(H) x 7(W) x2(T)mm.This holder can be easily transferredto the SEM without removing the sample.TEM Sample Holder (Quick ClampHolder)for single and double-sided low angle millingdown to 4 °.

Sample table ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ ye kɔnɔ. Sample table kënë lëu bï ya tɔ̈ɔ̈u në SEM yic ka tɛ̈ɛ̈r

kä.

TEM sample clamps aye luɔ̈ɔ̈i bï ion beam ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye tɛ̈n ye t

TEM Frozen Sample Clamps aye tɔ̈u kek LN2 Refrigeration Device ye tɔ̈u yen bï samples ye tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen tɔ̈u yen.

FIB Cleaning Sample Table ye luɔɔi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi

Leica EM RES102 ye ion beam ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈n ye cɔk tɛ̈

› 19" Touch Screen Computer Control Unit, ye tïŋ ku tïŋ kä ye kek looi

› Application Parameter Library

› Programming Sample Parameters Setting, Accelerating Beginner Learning Curve

› Help Files kony kɔc ye yam bɛ̈n looi ku jɔl ya luɔɔi

Kɔɔr/wɛ̈ɛ̈r wɛ̈ɛ̈r wɛ̈ɛ̈r wɛ̈ɛ̈r wɛ̈ɛ̈r

› TEM, SEM, ku LM Application Functions

› TEM Sample Preparation yök thin zone, ka TEM Sample Preparation efficiency juak

› SEM Sample Preparation Up to 25mm Sample Diameter

› Pre-pumping room system kony bɛ̈ɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i bɛ̈i

› LAN Function for Remote Control

› LN2 Sampling Table bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi bɛ̈n looi

Gɛlɛya

› Automatic termination function, suitable for optical termination or transparent samples Faraday cup termination

› Yïn alëu ba fotow wala videow tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u

› Ion source and sample motion motor drive, programmatic control, so you can get repeated sampling results