M series full spectrum direct reading spectrometer uses international standard design and manufacturing process technology, all digital and Internet technology combined, using high resolution CMOS detector, precision designed argon blowing system, so that the instrument has a very high performance, low cost, and highly competitive price. M series full spectrum direct reading spectrometer uses international standard design and manufacturing process technology, all digital and Internet technology combined, using high resolution CMOS detector, precision designed argon blowing system, so that the instrument has a very high performance, low cost, and highly competitive price.


M4Spectrometer ye cɔl full spectrum direct spectrometer ye luɔɔi në multimatrix
01 Luɔi puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth puɔth
02 Luɔi ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈r ye kɛ̈ɛ̈
03 High Brightness Holographic Grinder ee 3600 bar/mm ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ ye kɔrɔ.
04 Argon blowing room ye argon blowing system ye min ca tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ ka tɛmɛ.
05 Application high resolution multi CMOS reading system, low dark current, better detection limit, higher stability, stronger sensitivity. 05 Application high resolution multi CMOS reading system, lower dark current, better detection limit, higher stability, stronger sensitivity. 05 Application high resolution multi CMOS reading system, lower dark current, better detection limit, higher stability, stronger sensitivity.
06 Teknoloji DDD ye dijital ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ
07 All-in-one open spark table, lëu bï kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l ye kɛ̈ɛ̈l.
08 Lɔ̈k kä juëc ye kek tɔ̈ɔ̈u në ɣän juëc yiic ku kä juëc ye kek tɔ̈ɔ̈u në ɣän juëc yiic ku kä ye kek tɔ̈ɔ̈u në ɣän juëc yiic.
09 A lëu bï ya juak ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ, ka tɛmɛ
Ajuiɛɛr de argon ye looi
A kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye.
Light room space optimization design, argon consumption reduction, and effective saving of production costs. Light room space optimization design, reducing argon consumption, and effective saving of production costs. Light room space optimization design, reducing argon consumption, and effective saving of production costs.
Argon ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye dɔɔni ye.
Argon ye kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ kɔnɔ

CMOS Detector ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ ye kɔnɔŋ
Spectral line ye kä thiin koor ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u ye kek tɔ̈ɔ̈u.
Ultraviolet zone detection ye kɛnɛya ye kɛnɛya ye kɛnɛya ye kɛnɛya ye kɛnɛya ye kɛnɛya ye kɛnɛya ye kɛnɛya ye kɛnɛya ye kɛnɛya ye.
A lëu bï ya kuanycök në kë de element sensitivity line, ku bï ya gam bï analysis ya cɔk ya cɔk ya cɔk ya cɔk ya cɔk ya cɔk ya cɔk ya cɔk ya cɔk.
Multi-peak fit technology, ye spectral line interference bɛ̈n ya cɔk tɔ̈ɔ̈u, ku bɛ̈n ya cɔk tɔ̈ɔ̈u.


Software Analyzer ye duno
1) CCD full spectrum graphical analysis software, ye tɔ̈u në thoŋ juëc yiic, ye tɔ̈u në Windows system, ye tɔ̈u në luɔɔi;
2) Kuen de kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye kɔc ye k
3) Instruments can configure multiple factory correction curves and more material analysis and advanced solutions. 3) Instruments can configure multiple factory correction curves and more material analysis and advanced solutions. 3) Instruments can configure multiple factory correction curves and more material analysis and advanced solutions.
4) Software bï algorithm de spectrum detection, smart button interference, darkening current, background and noise ya looi, ku bï käke analyzer ya juak;
5) Fully automated system diagnostic function; 5) Fully automated system diagnostic function; 5) Fully automated system diagnostic function; 5) Fully automated system diagnostic function; 5) Fully automated system diagnostic function;
6) Database management function, lëu bï ya tɛ̈ɛ̈r bï ya tɛ̈ɛ̈r bï ya tɛ̈ɛ̈r bï ya tɛ̈ɛ̈r.
7) Ajuiɛɛr ye kɔc cɔl 'smart correction algorithm' ye kɔc cɔl 'instrument stability' ye kɔc cɔl 'reliable';
8) Spectrum line information and interference deduction algorithms complete, ensuring instrument analysis is more accurate. 8) Spectrum line information complete and interference deduction algorithms complete, ensuring instrument analysis is more accurate. 8) Spectrum line information complete and interference deduction algorithms complete, ensuring instrument analysis is
9) Lɔ̈k Windows operating system ye kɔrɔ.

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