Prisma &Prisma EXMultifunctional environment vacuum tungsten lamp wire analysis scanning electron microscope

• Laboratory ye kɔc juëc luɔ̈ɔ̈i, SEM tungsten wire scanning electron microscope ye kɔc juëc luɔ̈ɔ̈i, ye kɔc juëc luɔ̈ɔ̈i, ye kɔc juëc luɔ̈ɔ̈i
• Tɛ̈n ESEM ™ Modɛl vacuum ambient
• High vacuum, low vacuum ku ESEM ™ Vacuum environment three vacuum modes, suitable for analysis of the most extensive samples, the range of samples includes electrical conductive materials, non-conductive materials, degassing, uncoated or other non-applicable vacuum samples. Vacuum environment three vacuum modes, suitable for analysis of the most extensive samples, the range of samples includes electrical conductive materials, non-conductive materials, degassing, uncoated or other non-applicable vacu
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• Low vacuum ku ESEM environment vacuum lëu bïk kä ye kek tɔ̈ɔ̈u ya tɔ̈ɔ̈u ya tɔ̈ɔ̈u ya tɔ̈ɔ̈u ya tɔ̈ɔ̈u ya tɔ̈ɔ̈u
• A tɛ̈n yenë yen tɔ̈u thïn aye kɛ sabab ye ka tɛ̈n yenë yen tɔ̈u thïn, ka tɛ̈n yenë yen tɔ̈u thïn, ka tɛ̈n yenë yen tɔ̈u th
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• Lɔ̈ɔ̈i në ɣän ke 165°C tënë 1400°C
• Voltage: 200 V - 30 kV
• E-zoom: 6x <unk> 1,000,000x (ka foto naani tɔ̈ɔ̈u ka tɔ̈ɔ̈u ka tɔ̈ɔ̈u)
• Detector: High vacuum mode Everhart-Thomley secondary electron detector (E-T SED) (E-T SED) (E-T SED) (E-T SED) (E-T SED) (E-T SED) (E-T SED) (E-T SED) (E-T SED) (E-T SED) Low vacuum SE detector (LVD) ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr ye kɔɔr; ESEM Environmental Vacuum Mode Gas Secondary Electronic Detector (GESD) ye looi në ɣän kɔ̈k peei yiic. Kamera CCD Infrared Room Sample
• Vacuum system: 1 250L/s turbomolecule pump, 1 rotary mechanical pump; Patent "through lens" pressure differential vacuum system; Taim de exhaust ≤3.5min to high vacuum, ≤4.5min to ESEM vacuum/low vacuum; CryoCleaner cold trap ye sɔrɔ; Optional upgrade to oil-free rolling/dry PVPs
• Sample Room:

o Diameter 340 mm

o Analyze tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n tɛ̈n

o 12 kaam-kaam-kaam-kaam

o EDS yic: 35°

• Resolution:

高真空模式

• 3.0 nm @ 30 kV (SE)
• 4.0 nm @ 30 kV (BSE) *
• 8.0 nm @ 3 kV (SE)

Mode de réduction sous vide élevé

• 7.0 nm @ 3 kV

Low vacuum mode

• 3.0 nm @ 30 kV (SE)
• 4.0 nm @ 30 kV (BSE)
• 10 nm @ 3 kV (SE)

• ESEM Environmental Vakuum
  • 3.0 nm @ 30 kV (SE)